Particle Property Evaluation Device LS Spectrometer
Reduce the effects of multiple scattering! A particle characterization device that allows measurement in the sample's original state.
The "LS Spectrometer" from Japan Quantum Design is a sophisticated particle characterization device based on SLS and DLS. To eliminate the contribution of multiple scattering to the data, it employs innovative 3D cross-correlation technology, and there is no need to dilute the sample. It allows for the measurement of particle size, shape and structure factors, molecular weight, and rotational and translational diffusion coefficients while maintaining the sample in its original state. 【Features】 ■ Particle characterization device based on SLS and DLS ■ No need to dilute the sample ■ Measurements can be made in the sample's original state ■ Effective in reducing the effects of multiple scattering *For more details, please refer to the PDF document or feel free to contact us.
- Company：日本カンタム・デザイン
- Price：Other
